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VOLUME 75 | ISSUE 12 | PAGE 772
Josephson effect in S_{\rm F}XS_{\rm F} junctions
N. M. Chtchelkatchev, W. Belzig*, C. Bruder*
L. D. Landau Institute for Theoretical Physics RAS, 117940 Moscow, Russia
*Departement Physik und Astronomie, Universität Basel, 4056 Basel, Switzerland


PACS: 74.50.+r, 74.80.-g, 75.70.-i
Abstract
We investigate the Josephson effect in S_{\rm F}XS_{\rm
F} junctions, where S_{\rm F} is a superconducting material with a ferromagnetic exchange field, and X a weak link. The critical current Ic increases with the (antiparallel) exchange fields if the distribution of transmission eigenvalues of the X-layer has its maximum weight at small values. This exchange field enhancement of the supercurrent does not exist if X is a diffusive normal metal. At low temperatures, there is a correspondence between the critical current in an S_{\rm F}IS_{\rm F} junction with collinear orientations of the two exchange fields, and the AC supercurrent amplitude in an SIS tunnel junction. The difference of the exchange fields h1-h2 in an S_{\rm F}IS_{\rm F} junction corresponds to the potential difference V1-V2 in an SIS junction; i.e., the singularity in Ic [in an S_{\rm F}IS_{\rm F} junction] at |h1-h2|=Δ12 is the analogue of the Riedel peak. We also discuss the AC Josephson effect in S_{\rm F}IS_{\rm F} junctions.


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